Application of X-ray microdiffraction as a tool for advanced materials characterisation
conference contribution
posted on 2007-01-01, 00:00 authored by Peter LynchPeter Lynch, A Stevenson, I Madsen, D Liang, D Lau, D Parry, N Tamura, S WilkinsApplication of X-ray microdiffraction as a tool for advanced materials characterisation
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Location
Melbourne, VictoriaLanguage
engPublication classification
E2.1 Full written paper - non-refereed / Abstract reviewedStart date
2007-02-12End date
2007-02-14Title of proceedings
CAM2007 : Proceedings of the 2007 CSIRO Advanced Materials Conference and WorkshopEvent
CSIRO Advanced Materials. Conference and Workshop (2007 : Melbourne, Victoria)Publisher
CSIROPlace of publication
[Melbourne, Vic.]Usage metrics
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