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Bayesian analysis of in-situ high-resolution X-ray diffraction synchrotron experiments of Ti-6Al-4V specimens undergoing tensile loading

conference contribution
posted on 2019-01-01, 00:00 authored by N Armstrong, Peter LynchPeter Lynch, Sitarama KadaSitarama Kada, Pavel CizekPavel Cizek, J A Kimpton, R A Antoniou
Linking the accumulation of microstructural damage prior to crack initiation to the lifing of aero-engines components would help to better predict the time that a component spends in this crack initiation stage We present the results and analysis of in-situ high-resolution X-ray diffraction (XRD) experiments of a Ti-6Al-4V specimen that experienced tensile loading using medium energy synchrotron X-rays (≤21 keV) carried out at the Australian Synchrotron. The XRD analysis characterised XRD line-broadening due to the build-up of dislocations and the formation of crystallites in α- and β-Ti-6Al-4V specimens. Using Bayesian XRD analysis methods, the density, spatial arrangement of dislocations, and crystallite size information for α- and β-phases of the Ti-6Al-4V was extracted from the XRD line-profiles, as a function of applied load. The XRD analysis was then compared and validated with transmission electron microscopy (TEM) analysis of the specimen before and after the loading. Comparison of the TEM and XRD analysis reveals broad agreement in terms of the microstructural damage of Ti-6Al-4V specimens.

History

Event

American Society of Mechanical Engineers. Conference (2019 : Phoenix, Arizona)

Volume

7A-2019

Series

American Society of Mechanical Engineers Conference

Pagination

1 - 10

Publisher

American Society of Mechanical Engineers

Location

Phoenix, Ariz.

Place of publication

New York, N.Y.

Start date

2019-06-17

End date

2019-06-21

ISBN-13

9780791858684

Language

eng

Publication classification

E1 Full written paper - refereed

Editor/Contributor(s)

[Unknown]

Title of proceedings

ASME Turbo Expo 2019 : Power for land, sea, and air : Proceedings of the ASME Turbomachinery and Technical Conference and Exposition