Characterisation of deformed microstructures using field-emission gun scanning electron microscopy (FEG-SEM) and electron backscatter diffraction (EBSD)
conference contribution
posted on 2004-01-01, 00:00 authored by Mark Nave, Matthew BarnettMatthew BarnettCharacterisation of deformed microstructures using field-emission gun scanning electron microscopy (FEG-SEM) and electron backscatter diffraction (EBSD)
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Event
Australian Conference on Microscopy and Microanalysis (18th : 2004 : Geelong, Vic.)Pagination
43 - 43Publisher
Australian Microscopy and Microanalysis SocietyLocation
Geelong, Vic.Place of publication
[Canberra, A.C.T.]Start date
2004-02-02End date
2004-02-06ISBN-13
9780958040822ISBN-10
0958040826Language
engPublication classification
L3 Extract of paper (minor conferences)Editor/Contributor(s)
S Crameri, M Horne, A Hyatt, L Lucas, A Marshall, D McCulloch, P Miller, A Spargo, R Van Driel, C Veitch, M Walker, J WardTitle of proceedings
ACMM18 : Microscopy by the BayUsage metrics
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