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Characterising HEMT devices for MMIC distortion prediction

conference contribution
posted on 2006-01-01, 00:00 authored by James Brinkhoff, A E Parker
Characterising HEMT devices for MMIC distortion prediction

History

Event

Conference on Microelectronics - Design, Technology and Packaging II

Volume

6035

Series

Proceedings of SPIE

Publisher

SPIE-INT SOC OPTICAL ENGINEERING

Location

Brisbane, AUSTRALIA

Place of publication

Bellingham, WA

Start date

2005-12-12

End date

2005-12-14

ISSN

0277-786X

ISBN-10

0-8194-6066-4

Language

English

Publication classification

EN.1 Other conference paper

Editor/Contributor(s)

A Harlz

Title of proceedings

MICROELECTRONICS: DESIGN, TECHNOLOGY, AND PACKAGING II

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