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Defect detection and identification of sources in GIS based on laboratory and on-site experience

Version 2 2024-06-04, 05:57
Version 1 2017-08-03, 10:28
conference contribution
posted on 2024-06-04, 05:57 authored by F Ahmed, AB Darus, Z Yusoff, Enamul HaqueEnamul Haque
The most common defects in GIS apparatus are due to the presence of metallic particles, protrusions, as well as floating shields which originate mainly from imperfect manufacturing process, operation of switches, or may become trapped during assemble. The presence of defects deteriorates the insulation strength of a compressed SF6GIS apparatus and causes serious limitation in its practical application. These defects can be detected by several techniques, one of which is that using acoustic sensors placed on the enclosure. This paper reports on the defect detection and identification of sources in GIS apparatus using acoustic technique, based on laboratory and on-site experience. The tests give satisfactory result.

History

Pagination

73-76

Location

Arlington, Virginia

Start date

1998-06-07

End date

1998-06-10

ISSN

0164-2006

Language

eng

Publication classification

EN.1 Other conference paper

Copyright notice

1998, IEEE

Title of proceedings

1998 : Proceedings of the IEEE International Symposium on Electrical Insulation

Event

IEEE Electrical Insulation. International Symposium (1998 : Arlington, Virginia)

Publisher

I E E E

Place of publication

Piscataway, N.J.

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