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Diagnosable-by-Design Model-Driven Development for IEC 61499 Industrial Cyber-Physical Systems

Version 2 2024-06-03, 02:58
Version 1 2024-04-16, 02:20
conference contribution
posted on 2024-06-03, 02:58 authored by B Dowdeswell, Roopak SinhaRoopak Sinha, SG MacDonell
Diagnosable-by-Design Model-Driven Development for IEC 61499 Industrial Cyber-Physical Systems

History

Volume

2020-October

Pagination

2183-2188

Location

Singapore

Start date

2020-10-19

End date

2020-10-21

ISSN

1553-572X

ISBN-13

9781728154145

Language

eng

Publication classification

E1.1 Full written paper - refereed

Title of proceedings

IECON 2020 : Proceedings of the 46th Annual Conference of the IEEE Industrial Electronics Society

Event

Industrial Electronics Society. Conference (2020 : 46th : Singapore)

Publisher

IEEE

Place of publication

Piscataway, N.J.

Series

IEEE Industrial Electronics Society