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Discriminative clustering of high-dimensional data using generative modeling

Version 2 2024-06-06, 08:10
Version 1 2019-06-27, 09:59
conference contribution
posted on 2024-06-06, 08:10 authored by M Abdi, Chee Peng Lim, Shady MohamedShady Mohamed, S Nahavandi, E Abbasnejad, A Van Den Hengel
We approach unsupervised clustering from a generative perspective. We hybridize Variational Autoencoder (VAE) and Generative Adversarial Network (GAN) in a novel way to obtain a vigorous clustering model that can effectively be applied to challenging high-dimensional datasets. The powerful inference of the VAE is used along with a categorical discriminator that aims to obtain a cluster assignment of the data, by maximizing the mutual information between the observations and their predicted class distribution. The discriminator is regularized with examples produced by an adversarial generator, whose task is to trick the discriminator into accepting them as real data. We demonstrate that using a shared latent representation greatly helps with discriminative power of our model and leads to a powerful unsupervised clustering model. The method can be applied to raw data in a high-dimensional space. Training can be performed end-to-end from randomly-initialized weights by alternating stochastic gradient descent on the parameters of the model. Experiments on two datasets including the challenging MNIST dataset show that the proposed method performs better than the existing models. Additionally, our method yields an efficient generative model.

History

Pagination

799-802

Location

Windsor, Ont.

Start date

2018-08-05

End date

2018-08-08

ISSN

1548-3746

ISBN-13

9781538673928

Language

eng

Publication classification

E1 Full written paper - refereed

Copyright notice

2018, IEEE

Editor/Contributor(s)

[Unknown]

Title of proceedings

MWSCAS 2018 : Proceedings of the 2018 IEEE 61st International Midwest Symposium on Circuits and Systems

Event

IEEE Circuits and Systems Society. Conference (61st : 2018 : Windsor, Ont.)

Publisher

Institute of Electrical and Electronics Engineers

Place of publication

Piscataway, N.J.

Series

IEEE Circuits and Systems Society Conference