Eliminating of the drawback of existing testing technique of easily testable PLAs using an improved testing algorithm with product line rearrangement
Version 2 2024-06-03, 07:42
Version 1 2002-01-01, 00:00
conference contribution
posted on 2024-06-03, 07:42 authored by M Islam, Morshed ChowdhuryEliminating of the drawback of existing testing technique of easily testable PLAs using an improved testing algorithm with product line rearrangement
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Location
San Diego, California, USALanguage
engPublication classification
E1 Full written paper - refereedCopyright notice
2002, International Society for Computers and their ApplicationsEditor/Contributor(s)
Subramanya SPagination
239-242Start date
2002-11-07End date
2002-11-09ISBN-13
9781880843451ISBN-10
1880843455Title of proceedings
International Society for Computers and their Applications : 15th International conference on computer applications in industry and engineeringEvent
International Conference Computer Applications in Industry and Engineering (15th : 2002 : San Diego, California)Publisher
International Society for Computers and their ApplicationsPlace of publication
Cary, N.C.Usage metrics
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