Eliminating of the drawback of existing testing technique of easily testable PLAs using an improved testing algorithm with product line rearrangement

Islam, MD Rafiqul; Chowdhury, Morshed

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Eliminating of the drawback of existing testing technique of easily testable PLAs using an improved testing algorithm with product line rearrangement

conference contribution

posted on 2002-01-01, 00:00 authored by MD Rafiqul Islam, Morshed ChowdhuryMorshed Chowdhury

Eliminating of the drawback of existing testing technique of easily testable PLAs using an improved testing algorithm with product line rearrangement

History

Event

International Conference Computer Applications in Industry and Engineering (15th : 2002 : San Diego, California)

Pagination

239 - 242

Publisher

International Society for Computers and their Applications

Location

San Diego, California, USA

Place of publication

Cary, N.C.

Start date

2002-11-07

End date

2002-11-09

ISBN-13

9781880843451

ISBN-10

1880843455

Language

eng

Publication classification

E1 Full written paper - refereed

Copyright notice

2002, International Society for Computers and their Applications

Editor/Contributor(s)

S Subramanya

Title of proceedings

International Society for Computers and their Applications : 15th International conference on computer applications in industry and engineering

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File(s) not publicly available

Eliminating of the drawback of existing testing technique of easily testable PLAs using an improved testing algorithm with product line rearrangement

History

Event

Pagination

Publisher

Location

Place of publication

Start date

End date

ISBN-13

ISBN-10

Language

Publication classification

Copyright notice

Editor/Contributor(s)

Title of proceedings

Usage metrics

Categories

Keywords

Licence

Exports