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Evaluation of reliability of transparent SiOCH by electrochemical methods

conference contribution
posted on 2007-01-01, 00:00 authored by N Nam, J Kim, D Kim, N Lee
Evaluation of reliability of transparent SiOCH by electrochemical methods

History

Event

International Symposium on Dry Process. (29th : 2007 : Tokyo, Japan)

Pagination

1 - 1

Publisher

DPS

Location

Tokyo, Japan

Place of publication

Tokyo, Japan

Start date

2007-11-13

End date

2007-11-14

Language

eng

Publication classification

EN.1 Other conference paper

Title of proceedings

DPS 2007 : Proceedings of 29th international Symposium on Dry Process

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