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Experiments on Using Combined Short Window Bivariate Autoregression for EEG Classification

conference contribution
posted on 2011-01-01, 00:00 authored by Hoang Tuan, Tran Dat, Phuoc NguyenPhuoc Nguyen, Xu Huang, Dhamendra Sharma
Experiments on Using Combined Short Window Bivariate Autoregression for EEG Classification

History

Pagination

372-375

Location

Cancun, MEXICO

Start date

2011-04-27

End date

2011-05-01

ISSN

1948-3546

Language

English

Publication classification

EN.1 Other conference paper

Title of proceedings

2011 5TH INTERNATIONAL IEEE/EMBS CONFERENCE ON NEURAL ENGINEERING (NER)

Event

5th International IEEE Engineering-in-Medicine-and-Biology-Society (EMBS) Conference on Neural Engineering (NER)

Publisher

IEEE

Place of publication

New York, N.Y.

Series

International IEEE EMBS Conference on Neural Engineering

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