Feature-induced partial multi-label learning
conference contribution
posted on 2018-01-01, 00:00 authored by G Yu, X Chen, C Domeniconi, J Wang, Z Li, Zili ZhangZili Zhang, X Wu© 2018 IEEE. Current efforts on multi-label learning generally assume that the given labels of training instances are noise-free. However, obtaining noise-free labels is quite difficult and often impractical, and the presence of noisy labels may compromise the performance of multi-label learning. Partial multi-label learning (PML) addresses the scenario in which each instance is annotated with a set of candidate labels, of which only a subset corresponds to the ground-truth. The PML problem is more challenging than partial-label learning, since the latter assumes that only one label is valid and may ignore the correlation among candidate labels. To tackle the PML challenge, we introduce a feature induced PML approach called fPML, which simultaneously estimates noisy labels and trains multi-label classifiers. In particular, fPML simultaneously factorizes the observed instance-label association matrix and the instance-feature matrix into low-rank matrices to achieve coherent low-rank matrices from the label and the feature spaces, and a low-rank label correlation matrix as well. The low-rank approximation of the instance-label association matrix is leveraged to estimate the association confidence. To predict the labels of unlabeled instances, fPML learns a matrix that maps the instances to labels based on the estimated association confidence. An empirical study on public multi-label datasets with injected noisy labels, and on archived proteomic datasets, shows that fPML can more accurately identify noisy labels than related solutions, and consequently can achieve better performance on predicting labels of instances than competitive methods.
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Pagination
1398-1403Location
SingaporeStart date
2018-11-17End date
2018-11-20ISSN
1550-4786ISBN-13
9781538691588Language
engPublication classification
E1 Full written paper - refereedCopyright notice
2018, IEEETitle of proceedings
IEEE ICDM 2018 : International Conference on Data MiningEvent
Data Mining. IEEE International Conference (2018 : Singapore)Publisher
IEEEPlace of publication
Piscataway, N.J.Usage metrics
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