Generalized second order identifiability condition and relevant testing technique

Abed-Meraim, K; Xiang, Yong; Hua, Y

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Generalized second order identifiability condition and relevant testing technique

conference contribution

posted on 2000-01-01, 00:00 authored by K Abed-Meraim, Yong XiangYong Xiang, Y Hua

Generalized second order identifiability condition and relevant testing technique

History

Event

Acoustics, Speech and Signal Processing. IEEE International Conference (2000 : Istanbul, Turkey)

Pagination

2989 - 2992

Publisher

IEEE

Location

Istanbul, Turkey

Place of publication

Piscataway, N.J.

Publisher DOI

https://doi.org/10.1109/ICASSP.2000.861163

Start date

2000-06-05

End date

2000-06-09

ISBN-10

0780362934

Language

eng

Publication classification

E1.1 Full written paper - refereed

Title of proceedings

ICASSP 2000 : Proceedings of the Acoustics, Speech and Signal Processing IEEE 2000 International Conference

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Generalized second order identifiability condition and relevant testing technique

Research Publications

Keywords

correlation methods matrix algebra probability random processes theorem proving vectors white noise

File(s) under permanent embargo

Generalized second order identifiability condition and relevant testing technique

History

Event

Pagination

Publisher

Location

Place of publication

Publisher DOI

Start date

End date

ISBN-10

Language

Publication classification

Title of proceedings

Usage metrics

Read the peer-reviewed publication

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Keywords

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