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HDF: Hybrid deep features for scene image representation

Version 2 2024-06-05, 11:55
Version 1 2020-09-21, 15:20
conference contribution
posted on 2024-06-05, 11:55 authored by Chiranjibi Sitaula, Yong XiangYong Xiang, Anish Basnet, Sunil AryalSunil Aryal, Xuequan Lu
Nowadays it is prevalent to take features extracted from pre-trained deep learning models as image representations which have achieved promising classification performance. Existing methods usually consider either object-based features or scene-based features only. However, both types of features are important for complex images like scene images, as they can complement each other. In this paper, we propose a novel type of features – hybrid deep features, for scene images. Specifically, we exploit both object-based and scene-based features at two levels: part image level (i.e., parts of an image) and whole image level (i.e., a whole image), which produces a total number of four types of deep features. Regarding the part image level, we also propose two new slicing techniques to extract part based features. Finally, we aggregate these four types of deep features via the concatenation operator. We demonstrate the effectiveness of our hybrid deep features on three commonly used scene datasets (MIT-67, Scene-15, and Event-8), in terms of the scene image classification task. Extensive comparisons show that our introduced features can produce state-of-the-art classification accuracies which are more consistent and stable than the results of existing features across all datasets.

History

Pagination

1-8

Location

Online from Glasgow, Scotland

Start date

2020-07-19

End date

2020-07-24

ISBN-13

978-1-7281-6926-2

Language

eng

Publication classification

E1 Full written paper - refereed

Editor/Contributor(s)

[Unknown]

Title of proceedings

IJCNN 2020 : Proceedings of the 2020 International Joint Conference on Neural Networks

Event

IEEE Computational Intelligence Society. Conference (2020 : Online from Glasgow, Scotland)

Publisher

Institute of Electrical and Electronics Engineers

Place of publication

Piscataway, N.J.

Series

IEEE Computational Intelligence Society Conference