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Haptics enabled offline AFM image analysis

conference contribution
posted on 2009-01-01, 00:00 authored by Asim BhattiAsim Bhatti, Saeid NahavandiSaeid Nahavandi, Mohammed Hossny
Current advancements in nanotechnology are dependent on the capabilities that can enable nano-scientists to extend their eyes and hands into the nano-world. For this purpose, a haptics (devices capable of recreating tactile or force sensations) based system for AFM (Atomic Force Microscope) is proposed. The system enables the nano-scientists to touch and feel the sample surfaces, viewed through AFM, in order to provide them with better understanding of the physical properties of the surface, such as roughness, stiffness and shape of molecular architecture. At this stage, the proposed work uses of ine images produced using AFM and perform image analysis to create virtual surfaces suitable for haptics force analysis. The research work is in the process of extension from of ine to online process where interaction will be done directly on the material surface for realistic analysis.

History

Event

Image and Vision Computing. International Conference (2009 : Dubai, United Arab Emirates)

Pagination

446 - 451

Publisher

World Academy of Science, Engineering and Technology

Location

Dubai, United Arab Emirates

Place of publication

[Dubai, UAE]

Start date

2009-02-04

End date

2009-02-09

Language

eng

Notes

Also published in Waset :Proceedings of World Academy of Science, Engineering and Technology, v.49 2009

Publication classification

E1 Full written paper - refereed

Copyright notice

2009, World Academy of Science, Engineering and Technology

Title of proceedings

ICIVC 2009 : Proceedings of the Image and Vision Computing 2009 international conference

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