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Haptics enabled offline AFM image analysis
conference contribution
posted on 2009-01-01, 00:00 authored by Asim BhattiAsim Bhatti, Saeid Nahavandi, Mohammed HossnyCurrent advancements in nanotechnology are dependent on the capabilities that can enable nano-scientists to extend their eyes and hands into the nano-world. For this purpose, a haptics (devices capable of recreating tactile or force sensations) based system for AFM (Atomic Force Microscope) is proposed. The system enables the nano-scientists to touch and feel the sample surfaces, viewed through AFM, in order to provide them with better understanding of the physical properties of the surface, such as roughness, stiffness and shape of molecular architecture. At this stage, the proposed work uses of ine images produced using AFM and perform image analysis to create virtual surfaces suitable for haptics force analysis. The research work is in the process of extension from of ine to online process where interaction will be done directly on the material surface for realistic analysis.
History
Event
Image and Vision Computing. International Conference (2009 : Dubai, United Arab Emirates)Pagination
446 - 451Publisher
World Academy of Science, Engineering and TechnologyLocation
Dubai, United Arab EmiratesPlace of publication
[Dubai, UAE]Start date
2009-02-04End date
2009-02-09Language
engNotes
Also published in Waset :Proceedings of World Academy of Science, Engineering and Technology, v.49 2009Publication classification
E1 Full written paper - refereedCopyright notice
2009, World Academy of Science, Engineering and TechnologyTitle of proceedings
ICIVC 2009 : Proceedings of the Image and Vision Computing 2009 international conferenceUsage metrics
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