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Incremental elliptical boundary estimation for anomaly detection in wireless sensor networks

Version 2 2024-06-04, 06:14
Version 1 2011-01-01, 00:00
conference contribution
posted on 2024-06-04, 06:14 authored by M Moshtaghi, C Leckie, S Karunasekera, JC Bezdek, Sutharshan RajasegararSutharshan Rajasegarar, M Palaniswami
Wireless Sensor Networks (WSNs) provide a low cost option for gathering spatially dense data from different environments. However, WSNs have limited energy resources that hinder the dissemination of the raw data over the network to a central location. This has stimulated research into efficient data mining approaches, which can exploit the restricted computational capabilities of the sensors to model their normal behavior. Having a normal model of the network, sensors can then forward anomalous measurements to the base station. Most of the current data modeling approaches proposed for WSNs require a fixed offline training period and use batch training in contrast to the real streaming nature of data in these networks. In addition they usually work in stationary environments. In this paper we present an efficient online model construction algorithm that captures the normal behavior of the system. Our model is capable of tracking changes in the data distribution in the monitored environment. We illustrate the proposed algorithm with numerical results on both real-life and simulated data sets, which demonstrate the efficiency and accuracy of our approach compared to existing methods.

History

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Location

Vancouver, Canada

Language

eng

Publication classification

E Conference publication, E1.1 Full written paper - refereed

Copyright notice

2011, IEEE

Editor/Contributor(s)

[Unknown]

Pagination

467-476

Start date

2011-12-11

End date

2011-12-14

ISSN

1550-4786

eISSN

2374-8486

ISBN-13

9780769544083

Title of proceedings

ICDM 2011 : Proceedings of the 2011 IEEE 11th International Conference on Data Mining

Event

IEEE Computer Society. Conference (11th : 2011 : Vancouver, Canada)

Publisher

Institute of Electrical and Electronics Engineers

Place of publication

Piscataway, N.J.

Series

IEEE Computer Society Conference