Intuitive haptics interface with accurate force estimation and reflection at nanoscale

© Springer International Publishing Switzerland 2015. Technologies, such as Atomic Force Microscopy (AFM), have proven to be one of the most versatile research equipments in the field of nanotechnology by providing physical access to the materials at nanoscale. Working principles of AFM involve physical interaction with the sample at nanometre scale to estimate the topography of the sample surface. Size of the cantilever tip, within the range of few nanometres diameter, and inherent elasticity of the cantilever allow it to bend in response to the changes in the sample surface leading to accurate estimation of the sample topography. Despite the capabilities of the AFM, there is a lack of intuitive user interfaces that could allow interaction with the materials at nanoscale, analogous to the way we are accustomed to at macro level. To bridge this gap of intuitive interface design and development, a haptics interface is designed in conjunction with Bruker Nanos AFM. Interaction with the materials at nanoscale is characterised by estimating the forces experienced by the cantilever tip employing geometric deformation principles. Estimated forces are reflected to the user, in a controlled manner, through haptics interface. Established mathematical framework for force estimation can be adopted for AFM operations in air as well as in liquid mediums.