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Investigation of self-assembled monolayer by atom probe microscopy

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Version 1 2019-05-01, 18:12
conference contribution
posted on 2024-06-03, 16:42 authored by B Gault, Wenrong YangWenrong Yang, KR Ratinac, R Zheng, F Braet, SP Ringer
Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

History

Volume

15

Pagination

272-273

Publisher DOI

Open access

  • Yes

Link to full text

ISSN

1431-9276

eISSN

1435-8115

Language

English

Publication classification

E3.1 Extract of paper

Title of proceedings

Microscopy and Microanalysis

Issue

SUPPL. 2

Publisher

CAMBRIDGE UNIV PRESS

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    Research Publications

    Categories

    Keywords

    Science & TechnologyTechnologyMaterials Science, MultidisciplinaryMicroscopyMaterials ScienceTOMOGRAPHY

    Licence

    All Rights Reserved

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