LabVIEW controlled atomic force microscopy for remote nanoelectronics laboratory
conference contribution
posted on 2024-09-20, 03:07 authored by S Mahata, MK Hota, CK Maiti, Ananda MaitiAnanda MaitiLabVIEW controlled atomic force microscopy for remote nanoelectronics laboratory
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Volume
51Location
INDIA, Amrita Univ, Amritapuri CampusPublisher DOI
Start date
2012-01-03End date
2012-01-05ISBN-13
9781457707261Language
EnglishPublication classification
E1.1 Full written paper - refereedTitle of proceedings
Proceedings - 2012 IEEE International Conference on Technology Enhanced Education, ICTEE 2012Event
2012 International Conference on Technology Enhanced Education (ICTEE)Publisher
IEEEPublication URL
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