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LabVIEW controlled atomic force microscopy for remote nanoelectronics laboratory

conference contribution
posted on 2024-09-20, 03:07 authored by S Mahata, MK Hota, CK Maiti, Ananda MaitiAnanda Maiti
LabVIEW controlled atomic force microscopy for remote nanoelectronics laboratory

History

Volume

51

Location

INDIA, Amrita Univ, Amritapuri Campus

Start date

2012-01-03

End date

2012-01-05

ISBN-13

9781457707261

Language

English

Publication classification

E1.1 Full written paper - refereed

Title of proceedings

Proceedings - 2012 IEEE International Conference on Technology Enhanced Education, ICTEE 2012

Event

2012 International Conference on Technology Enhanced Education (ICTEE)

Publisher

IEEE

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