Line profile analysis of stacking faults and dislocations in DC magnetron sputtered gold films
conference contribution
posted on 2001-01-01, 00:00 authored by Peter LynchPeter Lynch, R Cheary, E Dooryhee, N ArmstrongLine profile analysis of stacking faults and dislocations in DC magnetron sputtered gold films
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Location
Gaithersburg, MarylandLanguage
engPublication classification
E2.1 Full written paper - non-refereed / Abstract reviewedCopyright notice
2001, National Institute of Standards and TechnologyStart date
2001-04-22End date
2001-04-25Title of proceedings
APD 2001 : Proceedings of the 3rd Accuracy in Powder Diffraction meeting 2001Event
Accuracy in Powder Diffraction. Meeting (3rd : 2001 : Gaithersburg, Maryland)Publisher
National Institute of Standards and TechnologyPlace of publication
[Gaithersburg, Md.]Usage metrics
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