Metallic nanoshell for three-dimensional chemical mapping of low conductive materials with pulsed-voltage atom probe tomography
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Version 1 2017-07-01, 00:00Version 1 2017-07-01, 00:00
conference contribution
posted on 2024-06-03, 21:04 authored by VR Adineh, Ross MarceauRoss Marceau, J FuMetallic nanoshell for three-dimensional chemical mapping of low conductive materials with pulsed-voltage atom probe tomography
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Location
St. Louis, Mo.Open access
- Yes
Language
EnglishPublication classification
E1.1 Full written paper - refereedCopyright notice
2017, Microscopy Society of AmericaEditor/Contributor(s)
[Unknown]Volume
23Pagination
682-683Start date
2017-08-06End date
2017-08-10ISSN
1431-9276eISSN
1435-8115Title of proceedings
M&M 2017 : Proceedings of the Microscopy and Microanalysis 2017 MeetingEvent
Microscopy Society of America. Meeting (2017 : St. Louis, Mo.)Issue
S1Publisher
Cambridge University PressPlace of publication
Cambridge, EnglandSeries
Microscopy Society of America MeetingUsage metrics
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