Model-based Combined Tracking and Resolution Enhancement
conference contribution
posted on 2008-01-01, 00:00 authored by Annika Kuhl, Tele Tan, Svetha VenkateshSvetha VenkateshModel-based Combined Tracking and Resolution Enhancement
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Location
Tampa, FLLanguage
EnglishPublication classification
EN.1 Other conference paperPagination
201-204Start date
2008-12-08End date
2008-12-11ISSN
1051-4651ISBN-13
978-1-4244-2174-9Title of proceedings
19TH INTERNATIONAL CONFERENCE ON PATTERN RECOGNITION, VOLS 1-6Event
19th International Conference on Pattern Recognition (ICPR 2008)Publisher
IEEESeries
International Conference on Pattern RecognitionUsage metrics
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