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On the repudiability of device identification and image integrity verification using sensor pattern noise
Version 2 2024-06-05, 03:29
Version 1 2019-07-09, 14:54
conference contribution
posted on 2024-06-05, 03:29 authored by Chang-Tsun LiChang-Tsun Li, CY Chang, Y LiOn the repudiability of device identification and image integrity verification using sensor pattern noise
History
Volume
41 LNICSTPagination
19-25Location
City Univ London, London, ENGLANDPublisher DOI
Start date
2009-09-07End date
2009-09-08ISSN
1867-8211eISSN
1867-822XISBN-13
9783642115295ISBN-10
3642115292Language
EnglishPublication classification
E1.1 Full written paper - refereedEditor/Contributor(s)
Weerasinghe DTitle of proceedings
Lecture Notes of the Institute for Computer Sciences, Social-Informatics and Telecommunications EngineeringEvent
1st International Conference on Information Security and Digital ForensicsPublisher
SPRINGERSeries
Lecture Notes of the Institute for Computer Sciences Social Informatics and Telecommunications EngineeringUsage metrics
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No categories selectedKeywords
Science & TechnologyTechnologyComputer Science, Information SystemsComputer Science, Theory & MethodsEngineering, Electrical & ElectronicComputer ScienceEngineeringDigital Device IdentificationDigital ForensicsDigital InvestigationDigital EvidenceSensor Pattern NoiseIntegrity VerificationEXPOSING DIGITAL FORGERIES
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