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One-Pass Logistic Regression for Label-Drift and Large-Scale Classification on Distributed Systems

conference contribution
posted on 2017-01-31, 00:00 authored by Tien Vu Nguyen, Tu Dinh Nguyen, Trung Minh Le, Svetha VenkateshSvetha Venkatesh, Quoc-Dinh Phung
One-Pass Logistic Regression for Label-Drift and Large-Scale Classification on Distributed Systems

History

Event

IEEE Data Mining. (ICDM) International Conference. (16th: 2016: Barcelona, Spain)

Pagination

1113 - 1118

Publisher

IEEE

Location

Barcelona, Spain

Place of publication

Piscataway, N.J.

Start date

2016-12-12

End date

2016-12-15

ISSN

2374-8486

Language

eng

Publication classification

E Conference publication; E1 Full written paper - refereed

Copyright notice

2016, IEEE

Title of proceedings

IEEE 2016 : Proceedingsof the IEEE 16th International Conference on Data Mining (ICDM)