One-Pass Logistic Regression for Label-Drift and Large-Scale Classification on Distributed Systems

Nguyen, Vu; Nguyen, Tu Dinh; Le, Trung; Venkatesh, Svetha; Phung, Dinh

One-Pass Logistic Regression for Label-Drift and Large-Scale Classification on Distributed Systems

conference contribution

posted on 2024-06-05, 11:49 authored by Vu Nguyen, Tu Dinh Nguyen, Trung Le, Svetha VenkateshSvetha Venkatesh, Dinh Phung

One-Pass Logistic Regression for Label-Drift and Large-Scale Classification on Distributed Systems

History

Pagination

1113-1118

Location

Barcelona, Spain

Start date

2016-12-12

End date

2016-12-15

ISSN

2374-8486

ISBN-13

9781509054725

Language

eng

Publication classification

E Conference publication, E1 Full written paper - refereed

Copyright notice

2016, IEEE

Title of proceedings

IEEE 2016 : Proceedingsof the IEEE 16th International Conference on Data Mining (ICDM)

Event

IEEE Data Mining. (ICDM) International Conference. (16th: 2016: Barcelona, Spain)

Publisher

IEEE

Place of publication

Piscataway, N.J.

Usage metrics

Keywords

Logistic regression large-scale classification label-drift Apache Spark distributed system Pattern Recognition and Data Analytics 4605 Data management and data science 4606 Distributed computing and systems software

One-Pass Logistic Regression for Label-Drift and Large-Scale Classification on Distributed Systems

History

Pagination

Location

Start date

End date

ISSN

ISBN-13

Language

Publication classification

Copyright notice

Title of proceedings

Event

Publisher

Place of publication

Usage metrics

Categories

Keywords

Licence

Exports