PVD TiN hardmask for copper metallization
conference contribution
posted on 2023-06-23, 05:33 authored by Zhigang Xie, Ashish Bodke, Jianming Fu, Rahul Jauhari, Magdy AbdelrahmanPVD TiN hardmask for copper metallization
History
Pagination
419-421Location
Santa Clara, Calif.Publisher DOI
Start date
2007-10-15End date
2007-10-17ISSN
1523-553XISBN-13
978-1-4244-1141-2Language
EnglishPublication classification
E1.1 Full written paper - refereedTitle of proceedings
ISSM 2007 : Proceedings of the International Symposium on Semiconductor Manufacturing 2007Event
International Symposium on Semiconductor Manufacturing. (2007 : Santa Clara, Calif.)Publisher
IEEEPlace of publication
Piscataway, N.J.Usage metrics
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