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A New Coupled Metric Learning for Real-time Anomalies Detection with High-Frequency Field Programmable Gate Arrays
Version 2 2024-06-04, 14:49
Version 1 2023-04-24, 07:32
conference contribution
posted on 2024-06-04, 14:49 authored by Frank JiangFrank Jiang, D LuoA New Coupled Metric Learning for Real-time Anomalies Detection with High-Frequency Field Programmable Gate Arrays
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Pagination
1254-1261Location
Shenzhen, ChinaPublisher DOI
Start date
2014-12-14End date
2014-12-14ISBN-13
9781479942732Language
engPublication classification
E1.1 Full written paper - refereedTitle of proceedings
Proceedings of the 2014 IEEE International Conference on Data Mining Workshop (ICDMW 2014)Event
2014 IEEE International Conference on Data Mining Workshop (ICDMW 2014)Publisher
Institute of Electrical and Electronics Engineers (IEEE)Place of publication
Piscataway, New JerseyUsage metrics
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