Preparation of site specific atom probe tips using focused ion beam technology

conference contribution

posted on 2024-06-03, 21:04 authored by D McGrouther, W McKenzie, D Saxey, JM Cairney, Ross MarceauRoss Marceau, SP Ringer, PR Munroe

Preparation of site specific atom probe tips using focused ion beam technology

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DOI - Is version of https://doi.org/10.1017/S1431927606062866

Open access

Yes

Link to full text

https://www.cambridge.org/core/services/aop-cambridge-core/content/view/ABF14795124D33AB444E4C36A6F7E515/S1431927606062866a.pdf/div-class-title-preparation-of-site-specific-atom-probe-tips-using-focused-ion-beam-technology-div.pdf

Language

eng

Publication classification

CN.1 Other journal article

Volume

12

Pagination

1296-1297

ISSN

1431-9276

eISSN

1435-8115

Title of proceedings

Microscopy and microanalysis

Issue

SUPPL. 2

Publisher

Cambridge University Press

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All Rights Reserved

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