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Preparation of site specific atom probe tips using focused ion beam technology

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conference contribution
posted on 2006-08-01, 00:00 authored by D McGrouther, W McKenzie, D Saxey, J M Cairney, Ross MarceauRoss Marceau, S P Ringer, P R Munroe
Preparation of site specific atom probe tips using focused ion beam technology

History

Volume

12

Issue

SUPPL. 2

Pagination

1296 - 1297

ISSN

1431-9276

eISSN

1435-8115

Publication classification

CN.1 Other journal article

Title of proceedings

Microscopy and Microanalysis

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