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Remotely triggered semiconductor devices characterization laboratory in cloud environment

conference contribution
posted on 2024-09-20, 03:09 authored by Ananda MaitiAnanda Maiti
Remotely triggered semiconductor devices characterization laboratory in cloud environment

History

Volume

1

Pagination

1208-1213

Publisher DOI

Start date

2012-08-20

End date

2012-08-23

ISBN-13

9781467324182

Publication classification

E1.1 Full written paper - refereed

Title of proceedings

Proceedings of IEEE International Conference on Teaching, Assessment, and Learning for Engineering, TALE 2012

Event

2012 IEEE International Conference on Teaching, Assessment and Learning for Engineering (TALE)

Publisher

IEEE

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    All Rights Reserved

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