Robust Facial Feature Localization with Probabilistic Constrained Local Models

Wei, Lei; Gao, Wei; Shen, Yehu; Zhu, Yi; Mo, Rui; Peng, Zhenyun; Zhang, Yaohui

Robust Facial Feature Localization with Probabilistic Constrained Local Models

conference contribution

posted on 2025-03-10, 22:22 authored by Lei Wei, Wei Gao, Yehu Shen, Yi Zhu, Rui Mo, Zhenyun Peng, Yaohui Zhang

Robust Facial Feature Localization with Probabilistic Constrained Local Models

History

Pagination

480-484

Location

Chongqing, China

Open access

No

Start date

2012-10-16

End date

2012-10-18

ISBN-13

978-1-4673-0965-3

Language

eng

Publication classification

E1.1 Full written paper - refereed

Editor/Contributor(s)

Chen Q, Cheng Q, Li Y, Zhang T, Wang L

Title of proceedings

CISP 2012 : Proceedings of the 5th International Congress on Image and Signal Processing 2012

Event

Image and Signal Processing. Congress (5th : 2012 : Chongqing, China)

Publisher

IEEE

Place of publication

Piscataway, N.J.

Publication URL

https://doi.org/10.1109/cisp.2012.6469822

Usage metrics

Keywords

ACTIVE APPEARANCE MODELS CLM EM Engineering Engineering, Electrical & Electronic FACE face alignment PPCA Science & Technology SVM Technology

Robust Facial Feature Localization with Probabilistic Constrained Local Models

History

Pagination

Location

Open access

Start date

End date

ISBN-13

Language

Publication classification

Editor/Contributor(s)

Title of proceedings

Event

Publisher

Place of publication

Publication URL

Usage metrics

Categories

Keywords

Licence

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