Simulation-Enhanced Atom Probe for Complete 3D Atomistic Imaging

Moody, MP; Ceguerra, AV; Breen, AJ; Gault, B; Cui, XY; Stephenson, LT; Marceau, Ross; Powles, R; Ringer, SP

Simulation-Enhanced Atom Probe for Complete 3D Atomistic Imaging

https://hdl.handle.net/10536/DRO/DU:30097719
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conference contribution

posted on 2024-06-03, 21:04 authored by MP Moody, AV Ceguerra, AJ Breen, B Gault, XY Cui, LT Stephenson, Ross MarceauRoss Marceau, R Powles, SP Ringer

Simulation-Enhanced Atom Probe for Complete 3D Atomistic Imaging

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DOI - Is version of https://doi.org/10.1017/S1431927613006983

Location

Indianapolis, IN.

Language

eng

Publication classification

E3.1 Extract of paper

Volume

19

Pagination

998-999

Start date

2013-08-04

End date

2013-08-08

Title of proceedings

M&M 2013 : Microscopy & Microanalysis : Proceedings of the Microscopy Society of America conference 2013

Event

Microscopy Society of America. Conference (2013 : Indianapolis, IN.)

Issue

S2

Publisher

Cambridge University Press

Place of publication

Cambridge, U.K.

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Simulation-Enhanced Atom Probe for Complete 3D Atomistic Imaging

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