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Skin reflectance modelling for face recognition
conference contribution
posted on 2004-09-20, 00:00 authored by W A P Smith, Antonio Robles-KellyAntonio Robles-Kelly, E R HancockWe present a parameter-free method for estimating the BRDF of a subject's skin from a single image. We show how the technique can be used for photometric correction as a preprocessing step for face analysis tasks, and show its application to graphics by re-rendering faces with the different skin reflectance models.
History
Event
ICPR 2004 Pattern Recognition. International Conference (17th : 2004 : Cambridge, UK)Volume
3Pagination
210 - 213Publisher
Institute of Electrical and Electronics EngineersLocation
Cambridge, United KingdomPlace of publication
Piscataway, N.J.Publisher DOI
Start date
2004-08-23End date
2004-08-26ISSN
1051-4651ISBN-10
0-7695-2128-2Language
engPublication classification
E1.1 Full written paper - refereedCopyright notice
2004, IEEEEditor/Contributor(s)
Josef Kittler, Maria Petrou, Mark NixonTitle of proceedings
ICPR 2004 : Proceedings of the 17th International Conference on Pattern RecognitionUsage metrics
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