Successful application can only be achieved through reliable knowledge discovery: an Introduction to RIKD 2010
Version 2 2024-06-06, 11:22
Version 1 2014-11-20, 12:38
conference contribution
posted on 2024-06-06, 11:22 authored by H Dai, J Liu, E SmirnovRIKD 2010 is the Third International Workshop on Reliability Issues in Knowledge Discovery. This paper provides an introduction to the workshop. It summarizes the main workshop features and provides a formulation of the field of reliable knowledge discovery.
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Pagination
1-2Location
Sydney, NSWStart date
2014-12-14End date
2014-12-17ISSN
1550-4786ISBN-13
9780769542577ISBN-10
0769542573Language
engPublication classification
E Conference publication, E3.1 Extract of paperCopyright notice
2010, IEEETitle of proceedings
ICDM 2010 : Proceedings of the IEEE Data Mining Workshops 2010 International ConferenceEvent
IEEE Data Mining. International Conference (10th : 2010 : Sydney, N. S. W.)Publisher
IEEEPlace of publication
Los Alamitos, CalifUsage metrics
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