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Successful application can only be achieved through reliable knowledge discovery: an Introduction to RIKD 2010

Version 2 2024-06-06, 11:22
Version 1 2014-11-20, 12:38
conference contribution
posted on 2024-06-06, 11:22 authored by H Dai, J Liu, E Smirnov
RIKD 2010 is the Third International Workshop on Reliability Issues in Knowledge Discovery. This paper provides an introduction to the workshop. It summarizes the main workshop features and provides a formulation of the field of reliable knowledge discovery.

History

Pagination

1-2

Location

Sydney, NSW

Publisher DOI

Start date

2014-12-14

End date

2014-12-17

ISSN

1550-4786

ISBN-13

9780769542577

ISBN-10

0769542573

Language

eng

Publication classification

E Conference publication, E3.1 Extract of paper

Copyright notice

2010, IEEE

Title of proceedings

ICDM 2010 : Proceedings of the IEEE Data Mining Workshops 2010 International Conference

Event

IEEE Data Mining. International Conference (10th : 2010 : Sydney, N. S. W.)

Publisher

IEEE

Place of publication

Los Alamitos, Calif

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    Keywords

    international workshopsknowledge Discoverydata mining080109 Pattern Recognition and Data Mining970108 Expanding Knowledge in the Information and Computing SciencesSchool of Information Technology

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    All Rights Reserved

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