Symmetric cross entropy for robust learning with noisy labels
Version 2 2024-06-06, 10:41Version 2 2024-06-06, 10:41
Version 1 2020-06-16, 15:11Version 1 2020-06-16, 15:11
conference contribution
posted on 2024-06-06, 10:41authored byYisen Wang, Xingjun Ma, Zaiyi Chen, Yuan Luo, Jinfeng Yi, James Bailey
Training accurate deep neural networks (DNNs) in the presence of noisy labels is an important and challenging task. Though a number of approaches have been proposed for learning with noisy labels, many open issues remain. In this paper, we show that DNN learning with Cross Entropy (CE) exhibits overfitting to noisy labels on some classes ("easy" classes), but more surprisingly, it also suffers from significant under learning on some other classes ("hard" classes). Intuitively, CE requires an extra term to facilitate learning of hard classes, and more importantly, this term should be noise tolerant, so as to avoid overfitting to noisy labels. Inspired by the symmetric KL-divergence, we propose the approach of Symmetric cross entropy Learning (SL), boosting CE symmetrically with a noise robust counterpart Reverse Cross Entropy (RCE). Our proposed SL approach simultaneously addresses both the under learning and overfitting problem of CE in the presence of noisy labels. We provide a theoretical analysis of SL and also empirically show, on a range of benchmark and real-world datasets, that SL outperforms state-of-the-art methods. We also show that SL can be easily incorporated into existing methods in order to further enhance their performance.
History
Pagination
322-330
Location
Seoul, South Korea
Start date
2019-10-27
End date
2019-11-02
ISSN
1550-5499
eISSN
2380-7504
ISBN-13
9781728148038
Language
eng
Publication classification
E1.1 Full written paper - refereed
Editor/Contributor(s)
[Unknown]
Title of proceedings
ICCV 2019 : Proceedings of the IEEE/CVF International Conference on Computer Vision
Event
Computer vision. International conference (2019 : Seoul, South Korea)