Test-Time Backdoor Detection for Object Detection Models

Zhang, Hangtao; Wang, Yichen; Yan, Shihui; Zhu, Chenyu; Zhou, Ziqi; Hou, Linshan; Hu, Shengshan; Li, Minghui; Zhang, Yanjun; Zhang, Leo

Test-Time Backdoor Detection for Object Detection Models

https://hdl.handle.net/10779/DRO/DU:30671216

conference contribution

posted on 2025-11-21, 00:32 authored by Hangtao Zhang, Yichen Wang, Shihui Yan, Chenyu Zhu, Ziqi Zhou, Linshan Hou, Shengshan Hu, Minghui Li, Yanjun Zhang, Leo ZhangLeo Zhang

Test-Time Backdoor Detection for Object Detection Models<p></p>

History

Related Materials

1.
DOI - Is version of https://doi.org/10.1109/cvpr52734.2025.02270

Location

Nashville, TN

Open access

No

Language

eng

Volume

00

Pagination

24377-24386

Start date

2025-06-10

End date

2025-06-17

Title of proceedings

CVPR 2025 : Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition

Event

Computer Vision and Pattern Recognition. Conference (2025 : Nashville, TN)

Publisher

IEEE

Usage metrics

Keywords

Uncategorised value

Test-Time Backdoor Detection for Object Detection Models

History

Related Materials

Location

Open access

Language

Volume

Pagination

Start date

End date

Title of proceedings

Event

Publisher

Usage metrics

Categories

Keywords

Licence

Exports