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X-ray diffraction characterisation of nanoparticle size and shape distributions : application to bimodal distributions

conference contribution
posted on 2004-01-01, 00:00 authored by N Armstrong, W Kalceff, J Cline, J Bonevich, Peter LynchPeter Lynch, C Tang, S Thompson
X-ray diffraction characterisation of nanoparticle size and shape distributions : application to bimodal distributions

History

Location

Wagga Wagga, N.S.W.

Language

eng

Publication classification

E2.1 Full written paper - non-refereed / Abstract reviewed

Start date

2004-02-03

End date

2004-02-06

Title of proceedings

Proceedings of the 28th Annual Condensed Matter and Materials Meeting 2004

Event

Condensed Matter and Materials. Meeting (28th : 2004 : Wagga Wagga, N.S.W.)

Publisher

[The Conference]

Place of publication

[Wagga Wagga, N.S.W.]

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    Categories

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    Keywords

    Bayesian\/Maximum entropyMarkov Chain Monte Carlo (MCMC)SRMXRD

    Licence

    All Rights Reserved

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