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Structural, Syntactic, and Statistical Pattern Recognition. Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17–19, 2018, Proceedings
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posted on 2018-01-01, 00:00 authored by Xiao Bai, Edwin R Hancock, Tin Kam Ho, Richard C Wilson, Battista Biggio, Antonio Robles-KellyAntonio Robles-KellyStructural, Syntactic, and Statistical Pattern Recognition. Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17–19, 2018, Proceedings
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Volume
11004Location
Beijing, ChinaPublisher DOI
Start date
2018-08-17End date
2018-08-19eISSN
1611-3349ISBN-13
978-3-319-97785-0ISBN-10
3319977857Language
engResearch statement
No research statement providedPublication classification
E4.1 Edited volume of conference proceedingsExtent
Structural, Syntactic, and Statistical Pattern RecognitionEditor/Contributor(s)
Bai X, Hancock ER, Ho TK, Wilson RC, Biggio B, Robles-Kelly AEvent
Joint IAPR International Workshop, S+SSPR 2018Publisher
SpringerPlace of publication
Cham, SwitzerlandSeries
Lecture Notes in Computer ScienceUsage metrics
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