lynch-laboratorybased-2007.pdf (1.03 MB)
A laboratory based system for Laue micro x-ray diffraction
journal contribution
posted on 2007-01-01, 00:00 authored by Peter LynchPeter Lynch, A Stevenson, D Liang, D Parry, S Wilkins, N TamuraA laboratory based system for Laue micro x-ray diffraction
History
Journal
Review of scientific instumentsVolume
78Issue
2Pagination
1 - 10Publisher
American Institute of PhysicsLocation
College Park, Md.ISSN
0034-6748eISSN
1089-7623Language
engPublication classification
C1.1 Refereed article in a scholarly journalCopyright notice
2007, American Institute of PhysicsUsage metrics
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