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A novel method to extract contact resistivity for thermoelectric semiconductor

Version 2 2024-06-03, 14:23
Version 1 2022-10-03, 00:24
journal contribution
posted on 2024-06-03, 14:23 authored by X Hu, X Liu, Z Guo, L Zhu
A novel method to extract contact resistivity for thermoelectric semiconductor

History

Journal

Review of Scientific Instruments

Volume

92

Article number

025110

Pagination

1-6

Location

Melville, N.Y.

ISSN

0034-6748

eISSN

1089-7623

Language

eng

Publication classification

C1.1 Refereed article in a scholarly journal

Issue

2

Publisher

AIP Publishing

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