A novel method to extract contact resistivity for thermoelectric semiconductor
Version 2 2024-06-03, 14:23
Version 1 2022-10-03, 00:24
journal contribution
posted on 2024-06-03, 14:23 authored by X Hu, X Liu, Z Guo, L ZhuA novel method to extract contact resistivity for thermoelectric semiconductor
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Journal
Review of Scientific InstrumentsVolume
92Article number
025110Pagination
1-6Location
Melville, N.Y.ISSN
0034-6748eISSN
1089-7623Language
engPublication classification
C1.1 Refereed article in a scholarly journalIssue
2Publisher
AIP PublishingUsage metrics
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