Accurate ultra-low-energy secondary ion mass spectrometry analysis of wide bandgap GaN/InxGa1-xN structures using optical conductivity enhancement

Morris, RJH; Dowsett, MG; Beanland, R; Parbrook, PJ; McConville, CF

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Accurate ultra-low-energy secondary ion mass spectrometry analysis of wide bandgap GaN/InxGa1-xN structures using optical conductivity enhancement

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Version 1 2020-09-22, 15:28

journal contribution

posted on 2024-06-18, 23:02 authored by RJH Morris, MG Dowsett, R Beanland, PJ Parbrook, CF McConville

Accurate ultra-low-energy secondary ion mass spectrometry analysis of wide bandgap GaN/InxGa1-xN structures using optical conductivity enhancement

History

Journal

Rapid Communications in Mass Spectrometry

Volume

24

Pagination

2122-2126

Location

England

Publisher DOI

https://doi.org/10.1002/rcm.4623

ISSN

0951-4198

eISSN

1097-0231

Language

English

Author URL

http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000280117200023&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=a045e4b2bb1f2b747c68c720ec8913b7

Publication classification

C1 Refereed article in a scholarly journal

Issue

14

Publisher

WILEY

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Keywords

Science & Technology Life Sciences & Biomedicine Physical Sciences Technology Biochemical Research Methods Chemistry, Analytical Spectroscopy Biochemistry & Molecular Biology Chemistry CHARGE COMPENSATION PROTOCOLS GROWTH BEAM SIMS

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File(s) under permanent embargo

Accurate ultra-low-energy secondary ion mass spectrometry analysis of wide bandgap GaN/InxGa1-xN structures using optical conductivity enhancement

History

Journal

Volume

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Publisher DOI

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eISSN

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Author URL

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Issue

Publisher

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Keywords

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