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An analytical loading model for n-tendon continuum robots

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Version 2 2024-06-03, 20:25
Version 1 2018-07-27, 12:41
journal contribution
posted on 2024-06-03, 20:25 authored by Mohsen Moradi Dalvand, S Nahavandi, RD Howe
OAPA One of the key design parameters in tendon-driven continuum robots is the number of tendons and the tendon loading distribution. A load model is also helpful for avoiding slack in tendons that causes control inefficiency and inaccuracy. A quasi-static model of n-tendon continuum robots is derived using the Euler–Lagrange formulation. The model is employed to derive an analytical loading model for equidistant tendon tensions for any given beam configuration within the workspace. The model accounts for the bending and axial compliance of the manipulator as well as tendon compliance. Features of the proposed model are discussed and some of the potential applications are explained. Based on the proposed model, a slack avoidance algorithm with analytical formulation is developed to dynamically optimize the tendon loads while preventing slack in tendons for a given configuration. The proposed model is experimentally validated in a multitendon continuum robot system for four case studies of three- to six-tendon arrangements in open-loop control architecture. A stereo vision-based three-dimensional reconstruction system measures the beam configuration and properties for each of the three- to six-tendon continuum robots. The effect of number of tendons on the tension loads in n-tendon continuum robots is studied. A quantitative dimensionless relationship between the number of tendons, the maximum tendon loads, and the bending angles is developed that may be used as a design tool for tradeoff among the complexity and required force and size.

History

Journal

IEEE transactions on robotics

Volume

34

Pagination

1215-1225

Location

Piscataway, N.J.

Open access

  • Yes

ISSN

1552-3098

Language

eng

Publication classification

C1 Refereed article in a scholarly journal

Copyright notice

2018, IEEE

Issue

5

Publisher

Institute of Electrical and Electronics Engineers