Analysis of Artifacts on Chipless RFID Backscatter Tag Signals for Real World Implementation
Version 2 2024-06-13, 14:37Version 2 2024-06-13, 14:37
Version 1 2019-01-01, 00:00Version 1 2019-01-01, 00:00
journal contribution
posted on 2024-06-13, 14:37 authored by G Khadka, MA Bibile, LM Arjomandi, NC KarmakarAnalysis of Artifacts on Chipless RFID Backscatter Tag Signals for Real World Implementation
History
Related Materials
- 1.
Location
Piscataway, N.J.Open access
- Yes
Link to full text
Language
engPublication classification
C1.1 Refereed article in a scholarly journalJournal
IEEE AccessVolume
7Pagination
66821-66831ISSN
2169-3536eISSN
2169-3536Publisher
Institute of Electrical and Electronics EngineersUsage metrics
Categories
No categories selectedLicence
Exports
RefWorksRefWorks
BibTeXBibTeX
Ref. managerRef. manager
EndnoteEndnote
DataCiteDataCite
NLMNLM
DCDC

