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Analysis of Artifacts on Chipless RFID Backscatter Tag Signals for Real World Implementation
Version 2 2024-06-13, 14:37Version 2 2024-06-13, 14:37
Version 1 2021-08-25, 08:08Version 1 2021-08-25, 08:08
journal contribution
posted on 2024-06-13, 14:37 authored by G Khadka, MA Bibile, LM Arjomandi, NC KarmakarAnalysis of Artifacts on Chipless RFID Backscatter Tag Signals for Real World Implementation
History
Journal
IEEE AccessVolume
7Pagination
66821-66831Location
Piscataway, N.J.Publisher DOI
Open access
- Yes
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ISSN
2169-3536eISSN
2169-3536Language
engPublication classification
C1.1 Refereed article in a scholarly journalPublisher
Institute of Electrical and Electronics EngineersUsage metrics
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