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Analytic solution for the three-layer multiple beam interferometer

journal contribution
posted on 1991-01-01, 00:00 authored by Roger Horn, D Smith
We present a simple analytic solution for the condition of constructive interference for light transmitted through an interferometer incorporating three ideally transparent layers of arbitrary thickness and refractive index. We also consider the effect of adding two metallic coatings to the outer surfaces of the interferometer and give empirical expressions for the associated phase changes for silver coatings on silica, sapphire, and mica substrates. A particular application to fringes of equal chromatic order can be utilized to obtain precise measurements of the thickness of extremely thin films sandwiched between two substrates.

History

Journal

Applied Optics

Volume

30

Issue

1

Pagination

59 - 65

Publisher

Optical Society of America

Location

New York, N. Y.

ISSN

1559-128X

eISSN

2155-3165

Language

eng

Publication classification

C1.1 Refereed article in a scholarly journal

Copyright notice

1991, Optical Society of America

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