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Atom Probe Tomography for the Observation of Hydrogen in Materials: A Review

journal contribution
posted on 2024-07-02, 02:11 authored by YS Chen, PY Liu, R Niu, A Devaraj, HW Yen, Ross MarceauRoss Marceau, JM Cairney
Abstract Atom probe tomography (APT) is an emerging microscopy technique that has high sensitivity for hydrogen with sub-nanometre-scale spatial resolution, which makes it a unique method to investigate the atomic-scale distribution of hydrogen at interfaces and defects in materials. This article introduces the basics of APT-based hydrogen analysis, particularly the challenge of distinguishing a hydrogen background signal in APT by using hydrogen isotopes, along with strategies to yield high-quality analysis. This article also reviews several important findings on hydrogen distribution in a range of materials, including both structural alloys and functional materials, enabled by using APT. Limitations and future opportunities for hydrogen analysis by APT are also discussed.

History

Journal

Microscopy and Microanalysis

Volume

29

Pagination

1-15

Location

Oxford, Eng.

Open access

  • No

ISSN

1431-9276

eISSN

1435-8115

Language

eng

Publication classification

C1 Refereed article in a scholarly journal, C1.1 Refereed article in a scholarly journal

Issue

1

Publisher

Oxford University Press