COMPARISON OF CAPACITANCE AND ELLIPSOMETRIC DATA FOR THE BASAL-PLANE OF BISMUTH SINGLE-CRYSTALS
Version 3 2024-06-19, 21:02
Version 2 2024-06-03, 00:11
Version 1 2023-11-02, 05:25
journal contribution
posted on 2024-06-19, 21:02 authored by T RAUD, Tim SilkTim Silk, U PALMCOMPARISON OF CAPACITANCE AND ELLIPSOMETRIC DATA FOR THE BASAL-PLANE OF BISMUTH SINGLE-CRYSTALS
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Language
EnglishPublication classification
C4.1 Letter or noteJournal
SOVIET ELECTROCHEMISTRYVolume
24Pagination
367-370ISSN
0038-5387Issue
3Publisher
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