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Cathodoluminescence microanalysis of diamond nanocrystals in fused silicon dioxide

Version 2 2024-06-17, 23:00
Version 1 2017-03-11, 23:47
journal contribution
posted on 2024-06-17, 23:00 authored by MA Stevens-Kalceff, S Prawer, W Kalceff, JO Orwa, JL Peng, JC McCallum, DN Jamieson
MeV carbon ion implantation followed by thermal annealing in a hydrogen-containing atmosphere produces a layer of diamond nanocrystals within fused quartz (SiO2). Cathodoluminescence (CL) microanalysis in a scanning electron microscope has revealed at least three previously unreported low intensity CL emissions from carbon implanted and thermally annealed fused SiO2. The CL emissions are observed at 2.78 eV [full width at half maximum (FWHM) of 0.08 eV], ∼3 eV (FWHM of 0.4 eV), and 3.18 eV (FWHM of 0.11 eV). The peak widths and energies of these emissions are incompatible with any known defects associated with the silicon dioxide host lattice. Nondestructive depth resolved CL microanalysis investigations confirm that these CL emissions originate from the near-surface region, consistent with their association with the layer of diamond nanocrystals. © 2008 American Institute of Physics.

History

Journal

Journal of applied physics

Volume

104

Article number

113514

Pagination

1-9

Location

Melville, N.Y.

ISSN

0021-8979

Language

eng

Publication classification

C Journal article, C1.1 Refereed article in a scholarly journal

Copyright notice

2008, American Institute of Physics

Issue

11

Publisher

American Institute of Physics

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