Cathodoluminescence microanalysis of diamond nanocrystals in fused silicon dioxide
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journal contribution
posted on 2024-06-17, 23:00 authored by MA Stevens-Kalceff, S Prawer, W Kalceff, JO Orwa, JL Peng, JC McCallum, DN JamiesonMeV carbon ion implantation followed by thermal annealing in a hydrogen-containing atmosphere produces a layer of diamond nanocrystals within fused quartz (SiO2). Cathodoluminescence (CL) microanalysis in a scanning electron microscope has revealed at least three previously unreported low intensity CL emissions from carbon implanted and thermally annealed fused SiO2. The CL emissions are observed at 2.78 eV [full width at half maximum (FWHM) of 0.08 eV], ∼3 eV (FWHM of 0.4 eV), and 3.18 eV (FWHM of 0.11 eV). The peak widths and energies of these emissions are incompatible with any known defects associated with the silicon dioxide host lattice. Nondestructive depth resolved CL microanalysis investigations confirm that these CL emissions originate from the near-surface region, consistent with their association with the layer of diamond nanocrystals. © 2008 American Institute of Physics.
History
Journal
Journal of applied physicsVolume
104Article number
113514Pagination
1-9Location
Melville, N.Y.Publisher DOI
ISSN
0021-8979Language
engPublication classification
C Journal article, C1.1 Refereed article in a scholarly journalCopyright notice
2008, American Institute of PhysicsIssue
11Publisher
American Institute of PhysicsUsage metrics
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