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Characterisation of sol-gel prepared (HfO2)x(SiO2)1-x (x=0.1, 0.2 and 0.4) by 1H, 13C, 17O and 29Si MAS NMR, FTIR and TGA
journal contribution
posted on 2008-01-01, 00:00 authored by L O’Dell, P Gunawidjaja, M Holland, G Mountjoy, D Pickup, R Newport, M SmithCharacterisation of sol-gel prepared (HfO2)x(SiO2)1-x (x=0.1, 0.2 and 0.4) by 1H, 13C, 17O and 29Si MAS NMR, FTIR and TGA
History
Journal
Solid state nuclear magnetic resonanceVolume
33Issue
1Pagination
16 - 24Publisher
ElsevierLocation
Amsterdam, The NetherlandsPublisher DOI
ISSN
0926-2040eISSN
1527-3326Language
engPublication classification
C1.1 Refereed article in a scholarly journalCopyright notice
2008, ElsevierUsage metrics
Keywords
17O NMRinorganic materialsnanoscale phase separationsol-gelScience & TechnologyPhysical SciencesTechnologyChemistry, PhysicalPhysics, Atomic, Molecular & ChemicalPhysics, Condensed MatterSpectroscopyChemistryPhysicsO-17 NMROXIDES MO2-SIO2 MSTATE NMRGATE DIELECTRICSSTRUCTURAL EVOLUTIONNEUTRON-DIFFRACTIONHYBRID MATERIALSHFZRXEROGELSGLASSESCondensed Matter Physics
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