Characterization of ion track morphology formed by swift heavy ion irradiation in silicon oxynitride films
Version 2 2024-06-13, 12:35
Version 1 2019-06-18, 15:52
journal contribution
posted on 2024-06-13, 12:35 authored by P Mota-Santiago, D Schauries, A Nadzri, K Vora, MC Ridgway, P KluthCharacterization of ion track morphology formed by swift heavy ion irradiation in silicon oxynitride films
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Journal
EPJ Web of ConferencesVolume
91Article number
ARTN 00008Location
Canberra, AUSTRALIAOpen access
- Yes
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2101-6275eISSN
2100-014XLanguage
EnglishPublication classification
C1.1 Refereed article in a scholarly journalEditor/Contributor(s)
Simenel C, Frohlich M, Lee BQ, Schauries DPublisher
E D P SCIENCESUsage metrics
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