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Characterizing grain-oriented silicon steel sheet using automated high-resolution Laue x-ray diffraction
journal contribution
posted on 2017-11-01, 00:00 authored by Peter LynchPeter Lynch, Matthew BarnettMatthew Barnett, A Stevenson, B HutchinsonControlling texture in grain-oriented (GO) silicon steel sheet is critical for optimization of its magnetization performance. A new automated laboratory system, based on X-ray Laue diffraction, is introduced as a rapid method for large scale grain orientation mapping and texture measurement in these materials. Wide area grain orientation maps are demonstrated for both macroetched and coated GO steel sheets. The large secondary grains contain uniform lattice rotations, the origins of which are discussed.